System on Chip testing is befalling more complex as processes become more refined, circuit scale increases, circuit operation becomes faster, and much less power is consumed. Our company’s Design for Test (DFT) reduces the difficulty and cost associated with testing an integrated circuit. Incorporated with ever-growing design complexity with multiple memories, mixed-signal blocks, and IPs from various vendors overloaded into a single SoC, Design for Test (DFT) implementation and Production Test signoff has become a big challenge.
To overcome this issue, in addition to compressed scan, memory BIST, and boundary scan DFT (Design for Testability), we perform high-quality testing using various types of DFT technology for improved test quality and yield. Faststream Technologies persuades Design for Test services to assist you to get rid of these problems by setting up a Design for Test strategy that delivers improved Design for Test (DFT) execution quality and reduced time-to-market.
BENEFITS WITH FASTSTREAM’S DFT TECHNOLOGIES