Faststream Technologies Embedded Process Detector circuit helps the Integrated Circuit (IC) developers to address the problem of process variability on low-geometry CMOS designs. The process detector provides means of detecting the process variation on individual chips, brought about by manufacturing variability, of core digital MOS devices. By using the process detector, IC developers are able to compensate for skewed manufacturing variations on chip.

Features:

• Processes TSMC 16FF+GL
• Exclusively digital signaling on ports
• Uses standard digital process layers
• Low power sleep mode
• Small size

Benefits:

• Exclusively digital signaling on ports
• Uses standard digital process layers
• Standard Logic Process

Applications:

• Speed grading of IC devices
• Dynamic Voltage and Frequency Scaling (DVFS) for system performance optimization
• Critical path analysis
• Critical supply voltage analysis
• Chip characterization and qualification
• Age monitoring

Deliverables:

• GDSII
• Abstract (LEF)
• Verilog Model
• Verilog Interface (optional)
• Liberty Timing Files