System on Chip testing is befalling more complex as processes become more refined, circuit scale increases, circuit operation becomes faster, and much less power is consumed. Incorporated with ever-growing design complexity with multiple memories, mixed signal blocks and IPs from various vendors overloaded into a single SoC, Design for Test (DFT) implementation and Production Test signoff has become a big challenge.
To overcome this issue, in addition to compressed scan, memory BIST, and boundary scan DFT, we perform high quality testing using various types of DFT technology for improved test quality and yield. Faststream Technologies persuades DFT services to assist you to get rid of these problems by setting up a DFT strategy that delivers improved DFT execution quality and reduced time-to market.
Benefits with Faststream’s DFT Technology